Real‐time in situ micro‐mechanical testing of hard metals using FIB‐SEM
October 1-6, 2017
The mechanical properties of WC/Co hardmetals were studied using in situ micro-mechanical characterisation techniques. Microscale pillars and cantilever beams were fabricated in different hardmetal microstructures using a focused ion beam microscope (FIB-SEM), to compare the behaviour between different orientation WC single crystals and polycrystalline structures. Micro-specimens in silicon were also tested to analyse the repeatability of the technique. The tests were done using a vacuum-compatible nanoindenter in a scanning electron microscope (SEM), which enabled simultaneous real-time observation of the test and acquisition of the load-displacement data.
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Helen Jones, Roger Morrell, Bryan Roebuck, Ken Mingard, Mark Gee, and David Cox, "Real‐time in situ micro‐mechanical testing of hard metals using FIB‐SEM" in "Nanomechanical Testing in Materials Research and Development VI", Karsten Durst, Technical University of Darmstadt, Germany Eds, ECI Symposium Series, (2017). http://dc.engconfintl.org/nanomechtest_vi/32