Title
Quantitative measurement of stress vs. strain in supported thin films by the layer compression test
Conference Dates
October 2 – 7, 2022
Abstract
Please click Additional Files below to see the full abstract.
Recommended Citation
Aaron D. Sinnott, "Quantitative measurement of stress vs. strain in supported thin films by the layer compression test" in "Nanomechanical Testing in Materials Research and Development VIII", Sandra Korte-Kerzel, RWTH Aachen University, Germany Eds, ECI Symposium Series, (2022). https://dc.engconfintl.org/nanomechtest_viii/14
48.pdf (363 kB)
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