Title
A geometry for quantitative analysis of interface fracture at the micron scale
Conference Dates
October 2 – 7, 2022
Abstract
Please click Additional Files below to see the full abstract.
Recommended Citation
Eloho Okotete, Subin Lee, Gerhard Dehm, Steffen Brinckmann, and Christoph Kirchlechner, "A geometry for quantitative analysis of interface fracture at the micron scale" in "Nanomechanical Testing in Materials Research and Development VIII", Sandra Korte-Kerzel, RWTH Aachen University, Germany Eds, ECI Symposium Series, (2022). https://dc.engconfintl.org/nanomechtest_viii/5
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