Characterizing novel transducers for high temperature thermal measurements using time domain thermoreflectance

Conference Dates

September 17-20, 2017


Time domain thermoreflectance (TDTR) is an optical pump-probe technique used to measure thermal properties of material systems. Samples are typically coated with a thin metal transducer layer, such as aluminum or gold. At temperatures approaching 2,000°C, most transducers become limited by melting temperature, chemical reactions, or other phase transitions. Hafnium Nitride (HfN) is a conductive ceramic with a melting point exceeding 3300°C. It is estimated to have a constant reflectance of 17% and 64% at 400nm and 800nm, respectively. Iridium (Ir) has a melting temperature of 2,447°C. Our work characterizes the thermal properties of HfN and Ir, respectively, and investigates their viability as transducers for TDTR measurements at high temperatures to the point of thermodynamically-driven failure. Thermal conductivity is measured as a function of temperature for HfN and Ir, respectively, and thermoreflectance coefficients are measured and compared to that of typical transducers. Thermal conductivities for MgO, Al2O3, SiO2, and diamond substrates are measured using the aforementioned thin films as transducers to test material reliability. Results and implications for future high temperature TDTR measurements are discussed.

This work is supported by the U.S. Office of Naval Research MURI program (grant No. N00014-15- 1-2863).

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