In situ observation of damage evolution in SiC/SiC under loading using X- ray Talbot-Lau interferometry and its applicability

Authors

• Yoshihisa Tanaka, Tokyo University of Technology, JapanFollow
• Takahiro Sekigawa, The Center for Ceramic Matrix Composites (CCMC), Tokyo University of Technology

Conference Dates

October 26-31, 2025

Abstract

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Recommended Citation

Yoshihisa Tanaka and Takahiro Sekigawa, "In situ observation of damage evolution in SiC/SiC under loading using X- ray Talbot-Lau interferometry and its applicability" in "Ceramic Matrix Composites III", R. Darolia, GE Aerospace; K. Goto, JAXA; T. Akatsu, Tokyo University of Technology; S. Kitaoka, Japan Fire Ceramics Center; G. Vignoles, University of Bordeaux Eds, ECI Symposium Series, (2025). https://dc.engconfintl.org/ceramic_matrix_composites_iii/41