Soft matter structure measurement by polarized resonant soft X-ray scattering
November 10-14, 2019
In many applications of soft matter, the connection between structure and performance is complex, and conventional structure measurements are not sufficient to provide a predictive structural model. Nanoscale variations in molecular orientation and composition, particularly in amorphous regions, are thought to be critical, but few techniques can probe them. I will describe our approach to polarized resonant soft X-ray scattering (P-RSoXS), which combines principles of soft X-ray spectroscopy, small-angle scattering, real-space imaging, and molecular simulation to produce a molecular scale structure measurement for soft materials and complex fluids. Progress and designs for a new P-RSoXS measurement station we are building at NIST beamlines at the National Synchrotron Light Source II will be shown.
Please click Additional Files below to see the full abstract.
Dean DeLongchamp, "Soft matter structure measurement by polarized resonant soft X-ray scattering" in "Composites at Lake Louise 2019", John Kieffer, University of Michigan, USA Erik Spoeke, Sandia National Laboratories, USA Meisha Shofner, Georgia Institution of Technology, USA Eds, ECI Symposium Series, (2019). https://dc.engconfintl.org/composites_all_2019/45