Title
Studies of Grain Boundaries by High Resolution TEM
Conference Dates
March 19-24, 2023
Abstract
Please click Additional Files below to see the full abstract
Recommended Citation
Klaus van Benthem, "Studies of Grain Boundaries by High Resolution TEM" in "Electric Field Enhanced Processing of Advanced Materials III: Complexities and Opportunities", Rishi Raj, University of Colorado Boulder, USA; Luis Perez-Maqueda, CICA, Spain Eds, ECI Symposium Series, (2022). https://dc.engconfintl.org/efe_advancedmaterials_iii/52
15.pdf (81 kB)
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