Nanoindentation meets APT, XRD, and EBSD: Multiphysical characterization of white etching layers in pearlitic rails

Authors

• Oleksandr Glushko, Department of Materials Science, Montanuniversität Leoben, Leoben, AustriaFollow
• Christoph Kammerhofer, voestalpine Rail Technology GmbH, Kerpelystraße 199, 8700 Leoben, Austria
• Kiranbabu Srikakulapu, Department of Materials Science, Montanuniversität Leoben, Leoben, Austria
• Juraj Todt, Department of Materials Science, Montanuniversität Leoben, Leoben, Austria
• Anna Jelinek, Department of Materials Science, Montanuniversität Leoben, Leoben, Austria
• Josef Keckes, Department of Materials Science, Montanuniversität Leoben, Leoben, Austria
• Ronald Schnitzer, Department of Materials Science, Montanuniversität Leoben, Leoben, Austria

Conference Dates

October 6-11, 2024

Abstract

Please click Additional Files below to see the full abstract

Recommended Citation

Oleksandr Glushko, Christoph Kammerhofer, Kiranbabu Srikakulapu, Juraj Todt, Anna Jelinek, Josef Keckes, and Ronald Schnitzer, "Nanoindentation meets APT, XRD, and EBSD: Multiphysical characterization of white etching layers in pearlitic rails" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/10