High temperature scanning indentation: Applications, limitations and perspectives

Authors

• Gaylord Guillonneau, ECL, CNRS, LTDS, UMR5513, Ecully, FranceFollow
• Gabrielle Tiphéne, IMAP, iMMC, UCLouvain, B-1348, Louvain-la-Neuve, Belgium
• Guillaume Kermouche, LGF, Mines Saint-Etienne, UMR5307, 42023 Saint Etienne, France
• Jean-Michel Bergheau, ECL, CNRS, LTDS, UMR5513, 69130 Ecully, France
• Warren Oliver, KLA Corporation, USA
• Jean-Luc Loubet, ECL, CNRS, LTDS, UMR5513, 69130 Ecully, France

Conference Dates

October 6-11, 2024

Abstract

Please click Additional Files below to see the full abstract.

Recommended Citation

Gaylord Guillonneau, Gabrielle Tiphéne, Guillaume Kermouche, Jean-Michel Bergheau, Warren Oliver, and Jean-Luc Loubet, "High temperature scanning indentation: Applications, limitations and perspectives" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/41