Tailor-made non-silicon AFM probes for nanomechanical and nanotribological testing

Authors

• Hanna Konopacka, Institute of Fundamental Technological Research, Polish Academy of Sciences, Warsaw, Poland, Faculty of Mechatronics, Warsaw University of Technology, Warsaw, PolandFollow
• Dariusz Jarząbek, Institute of Fundamental Technological Research, Polish Academy of Sciences, Poland, Faculty of Mechatronics, Warsaw University of Technology, Warsaw, Poland
• Piotr Jenczyk, Institute of Fundamental Technological Research, Polish Academy of Sciences, Poland
• Michał Milczarek, Institute of Fundamental Technological Research, Polish Academy of Sciences, Poland

Conference Dates

October 6-11, 2024

Abstract

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Recommended Citation

Hanna Konopacka, Dariusz Jarząbek, Piotr Jenczyk, and Michał Milczarek, "Tailor-made non-silicon AFM probes for nanomechanical and nanotribological testing" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/47