3D mapping of local stress by n3D-XRD-CT

Authors

• Thomas Edward James Edwards, NIMS, Tsukuba, JapanFollow
• Szilvia Kalácska, Mines Saint-Etienne, Univ Lyon, CNRS, UMR 5307 LGF, France
• Johann Michler, Empa, Feuerwerkerstrasse 39, 3602 Thun, Switzerland
• Jonathan Wright, European Synchrotron Radiation Facility, 38000, Grenoble, France

Conference Dates

October 6-11, 2024

Abstract

Please click Additional Files below to see the full abstract.

Recommended Citation

Thomas Edward James Edwards, Szilvia Kalácska, Johann Michler, and Jonathan Wright, "3D mapping of local stress by n3D-XRD-CT" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/57