Measuring thin film elastic constants using combined X-ray microdiffraction and micromechanical testing

Authors

• Rainer Hahn, Christian Doppler Laboratory for Surface Engineering of high-performance Components, TU Wien, ATFollow
• Rebecca Janknecht, Institute of Materials Science and Technology, TU Wien, Austria
• Nikola Koutná, Institute of Materials Science and Technology, TU Wien, Austria
• Juraj Todt, Department Materials Science, Montanuniversität Leoben, Austria
• Michael Meindlhumer, Department Materials Science, Montanuniversität Leoben, Austria
• Anton Davydok, Helmholtz-Zentrum Hereon, Institut für Werkstoffphysik, Germany
• Peter Polcik, Plansee Composite Materials GmbH, Germany
• Szilárd Kolozsvári, Plansee Composite Materials GmbH, Germany
• Carmen Jerg, Oerlikon Balzers, Oerlikon Surface Solutions AG, Liechtenstein
• Jozef Keckes, Department Materials Science, Montanuniversität Leoben, Austria
• Paul H. Mayrhofer, Institute of Materials Science and Technology, TU Wien, Austria
• Helmut Riedl, Christian Doppler Laboratory for Surface Engineering of high-performance Components, Austria

Conference Dates

October 6-11, 2024

Abstract

Please click Additional Files below to see the full abstract.

Recommended Citation

Rainer Hahn, Rebecca Janknecht, Nikola Koutná, Juraj Todt, Michael Meindlhumer, Anton Davydok, Peter Polcik, Szilárd Kolozsvári, Carmen Jerg, Jozef Keckes, Paul H. Mayrhofer, and Helmut Riedl, "Measuring thin film elastic constants using combined X-ray microdiffraction and micromechanical testing" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/61