Title
Micro-shear of silicon: Elastic strain analysis using digital image correlation
Conference Dates
October 2 – 7, 2022
Abstract
Please click Additional Files below to see the full abstract.
Recommended Citation
Carmen Maria Lauener, Fabian Schwarz, Jeffrey M. Wheeler, Johann Michler, Ralph Spolenak, and Laszlo Pethö, "Micro-shear of silicon: Elastic strain analysis using digital image correlation" in "Nanomechanical Testing in Materials Research and Development VIII", Sandra Korte-Kerzel, RWTH Aachen University, Germany Eds, ECI Symposium Series, (2022). https://dc.engconfintl.org/nanomechtest_viii/73
Carmen Maria Lauener.pdf (1179 kB)
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