Title
High-temperature scanning indentation: A new technique to assess microstrutural changes along thermal ramping
Conference Dates
October 2 – 7, 2022
Abstract
Thanks to recent developments in high temperature nanoindentation testing, investigation of thermally activated mechanisms at small length scales can now be carried out [1]. In-situ anisothermal measurements at the micron-scale of hardness, Young modulus and creep properties are now feasible. The development of the High Temperature Scanning Indentation [2] technique, based on a specific high-speed loading procedure, allows quasi-continuous determination of those properties in temperature in only few hours.
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Recommended Citation
Gabrielle Tiphene, Paul Baral, Solène COMBY-DASSONNEVILLE, Gaylord GUILLONNEAU, Guillaume KERMOUCHE, Jean-Michel BERGHEAU, and Warren OLIVER, "High-temperature scanning indentation: A new technique to assess microstrutural changes along thermal ramping" in "Nanomechanical Testing in Materials Research and Development VIII", Sandra Korte-Kerzel, RWTH Aachen University, Germany Eds, ECI Symposium Series, (2022). https://dc.engconfintl.org/nanomechtest_viii/88