Title
Detection of damage evolution in SiC/SiC under tensile loading using Talbot-Lau X-ray interferometer
Conference Dates
November 13 – 18, 2022
Abstract
Please click Additional Files below to see the full abstract
Recommended Citation
Yoshihisa Tanaka, "Detection of damage evolution in SiC/SiC under tensile loading using Talbot-Lau X-ray interferometer" in "Ceramic Matrix Composites II: Science and Technology of Materials, Design, Applications, Performance and Integration", Ram Darolia, GE Aviation, USA; Jon Binner, University of Birmingham, United Kingdom; Yutaka Kagawa, Tokyo University of Technology, Japan; Dietmar Koch, University of Augsburg, Germany; Rishi Raj, University of Colorado, USA; Gerard Vignoles, University of Bordeaux, France; Ken Goto, Japan Aerospace exploration agency (JAXA), Japan; Satoshi Kitaoka, Japan Fine Ceramics, (JFCC), Japan Eds, ECI Symposium Series, (2022). https://dc.engconfintl.org/cmcii/35