In situ micromechanical characterization of multi-layered thin films: Strain rate, size and microstructure related experiments

Authors

• Szilvia Kalácska, CNRS LGF, Mines St. Etienne, FranceFollow
• Laszlo Pethö, Empa Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland
• Johann Michler, Empa Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland
• Péter D. Ispánovity, Eötvös Loránd University, Budapest, Hungary

Conference Dates

October 6-11, 2024

Abstract

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Recommended Citation

Szilvia Kalácska, Laszlo Pethö, Johann Michler, and Péter D. Ispánovity, "In situ micromechanical characterization of multi-layered thin films: Strain rate, size and microstructure related experiments" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/112