Atomic scale characterization of deformation and fracture phenomena using a MEMS-based in situ STEM loading system

Authors

• Eita Tochigi, Institute of Industrial Science, University of Tokyo, JapanFollow
• Takaaki Sato, Institute of Industrial Science, The University of Tokyo
• Yuich i Ikuhara, Institute of Industrial Science, The University of Tokyo
• Naoya Shibata, Institute of Industrial Science, The University of Tokyo
• Minjian Cao, Institute of Industrial Science, The University of Tokyo

Conference Dates

October 6-11, 2024

Abstract

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Recommended Citation

Eita Tochigi, Takaaki Sato, Yuich i Ikuhara, Naoya Shibata, and Minjian Cao, "Atomic scale characterization of deformation and fracture phenomena using a MEMS-based in situ STEM loading system" in "Nanomechanical Testing in Materials Research and Development IX", Marco Sebastiani, Universita degli studi Roma Tre, Italy Eds, ECI Symposium Series, (2024). https://dc.engconfintl.org/nanomechtest_ix/113